In-situ monitoring of interface proximity effects in ultrathin ferroelectrics

The development of energy-efficient nanoelectronics based on ferroelectrics is hampered by a notorious polarization loss in the ultrathin regime caused by the unscreened polar discontinuity at the interfaces. So far, engineering charge screening at either the bottom or the top interface has been use...

Descripción completa

Detalles Bibliográficos
Autores principales: Strkalj, Nives, Gattinoni, Chiara, Vogel, Alexander, Campanini, Marco, Haerdi, Rea, Rossi, Antonella, Rossell, Marta D., Spaldin, Nicola A., Fiebig, Manfred, Trassin, Morgan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7669862/
https://www.ncbi.nlm.nih.gov/pubmed/33199714
http://dx.doi.org/10.1038/s41467-020-19635-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7669862/
https://www.ncbi.nlm.nih.gov/pubmed/33199714
http://dx.doi.org/10.1038/s41467-020-19635-7

Ejemplares similares