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In-situ monitoring of interface proximity effects in ultrathin ferroelectrics
The development of energy-efficient nanoelectronics based on ferroelectrics is hampered by a notorious polarization loss in the ultrathin regime caused by the unscreened polar discontinuity at the interfaces. So far, engineering charge screening at either the bottom or the top interface has been use...
Autores principales: | , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7669862/ https://www.ncbi.nlm.nih.gov/pubmed/33199714 http://dx.doi.org/10.1038/s41467-020-19635-7 |
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author | Strkalj, Nives Gattinoni, Chiara Vogel, Alexander Campanini, Marco Haerdi, Rea Rossi, Antonella Rossell, Marta D. Spaldin, Nicola A. Fiebig, Manfred Trassin, Morgan |
author_facet | Strkalj, Nives Gattinoni, Chiara Vogel, Alexander Campanini, Marco Haerdi, Rea Rossi, Antonella Rossell, Marta D. Spaldin, Nicola A. Fiebig, Manfred Trassin, Morgan |
author_sort | Strkalj, Nives |
collection | PubMed |
description | The development of energy-efficient nanoelectronics based on ferroelectrics is hampered by a notorious polarization loss in the ultrathin regime caused by the unscreened polar discontinuity at the interfaces. So far, engineering charge screening at either the bottom or the top interface has been used to optimize the polarization state. Yet, it is expected that the combined effect of both interfaces determines the final polarization state; in fact the more so the thinner a film is. The competition and cooperation between interfaces have, however, remained unexplored so far. Taking PbTiO(3) as a model system, we observe drastic differences between the influence of a single interface and the competition and cooperation of two interfaces. We investigate the impact of these configurations on the PbTiO(3) polarization when the interfaces are in close proximity, during thin-film synthesis in the ultrathin limit. By tailoring the interface chemistry towards a cooperative configuration, we stabilize a robust polarization state with giant polarization enhancement. Interface cooperation hence constitutes a powerful route for engineering the polarization in thin-film ferroelectrics towards improved integrability for oxide electronics in reduced dimension. |
format | Online Article Text |
id | pubmed-7669862 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-76698622020-11-24 In-situ monitoring of interface proximity effects in ultrathin ferroelectrics Strkalj, Nives Gattinoni, Chiara Vogel, Alexander Campanini, Marco Haerdi, Rea Rossi, Antonella Rossell, Marta D. Spaldin, Nicola A. Fiebig, Manfred Trassin, Morgan Nat Commun Article The development of energy-efficient nanoelectronics based on ferroelectrics is hampered by a notorious polarization loss in the ultrathin regime caused by the unscreened polar discontinuity at the interfaces. So far, engineering charge screening at either the bottom or the top interface has been used to optimize the polarization state. Yet, it is expected that the combined effect of both interfaces determines the final polarization state; in fact the more so the thinner a film is. The competition and cooperation between interfaces have, however, remained unexplored so far. Taking PbTiO(3) as a model system, we observe drastic differences between the influence of a single interface and the competition and cooperation of two interfaces. We investigate the impact of these configurations on the PbTiO(3) polarization when the interfaces are in close proximity, during thin-film synthesis in the ultrathin limit. By tailoring the interface chemistry towards a cooperative configuration, we stabilize a robust polarization state with giant polarization enhancement. Interface cooperation hence constitutes a powerful route for engineering the polarization in thin-film ferroelectrics towards improved integrability for oxide electronics in reduced dimension. Nature Publishing Group UK 2020-11-16 /pmc/articles/PMC7669862/ /pubmed/33199714 http://dx.doi.org/10.1038/s41467-020-19635-7 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Strkalj, Nives Gattinoni, Chiara Vogel, Alexander Campanini, Marco Haerdi, Rea Rossi, Antonella Rossell, Marta D. Spaldin, Nicola A. Fiebig, Manfred Trassin, Morgan In-situ monitoring of interface proximity effects in ultrathin ferroelectrics |
title | In-situ monitoring of interface proximity effects in ultrathin ferroelectrics |
title_full | In-situ monitoring of interface proximity effects in ultrathin ferroelectrics |
title_fullStr | In-situ monitoring of interface proximity effects in ultrathin ferroelectrics |
title_full_unstemmed | In-situ monitoring of interface proximity effects in ultrathin ferroelectrics |
title_short | In-situ monitoring of interface proximity effects in ultrathin ferroelectrics |
title_sort | in-situ monitoring of interface proximity effects in ultrathin ferroelectrics |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7669862/ https://www.ncbi.nlm.nih.gov/pubmed/33199714 http://dx.doi.org/10.1038/s41467-020-19635-7 |
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