Squeeze Film Damping Effect on Different Microcantilever Probes in Tapping Mode Atomic Force Microscope

During the operation of tapping mode atomic force microscope (TM-AFM), the gap between the cantilever and sample surface is very small (several nanometers to micrometers). Owing to the small gap distance and high vibration frequency, squeeze film force should be considered in TM-AFM. To explore the...

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Detalles Bibliográficos
Autores principales: Sun, Yan, Liu, Jing, Wang, Kejian, Wei, Zheng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2020
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7683126/
https://www.ncbi.nlm.nih.gov/pubmed/33282055
http://dx.doi.org/10.1155/2020/8818542

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7683126/
https://www.ncbi.nlm.nih.gov/pubmed/33282055
http://dx.doi.org/10.1155/2020/8818542

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