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Squeeze Film Damping Effect on Different Microcantilever Probes in Tapping Mode Atomic Force Microscope
During the operation of tapping mode atomic force microscope (TM-AFM), the gap between the cantilever and sample surface is very small (several nanometers to micrometers). Owing to the small gap distance and high vibration frequency, squeeze film force should be considered in TM-AFM. To explore the...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Hindawi
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7683126/ https://www.ncbi.nlm.nih.gov/pubmed/33282055 http://dx.doi.org/10.1155/2020/8818542 |