Contactless Measurement of Sheet Resistance of Nanomaterial Using Waveguide Reflection Method

Conductive nanomaterials are widely studied and used. The four-point probe method has been widely used to measure nanomaterials’ sheet resistance, denoted as [Formula: see text]. However, for materials sensitive to contamination or physical damage, contactless measurement is highly recommended if no...

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Detalles Bibliográficos
Autores principales: Ye, Ming, Tariq, Raja Usman, Zhao, Xiao-Long, Li, Wei-Da, He, Yong-Ning
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7699489/
https://www.ncbi.nlm.nih.gov/pubmed/33228247
http://dx.doi.org/10.3390/ma13225240

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7699489/
https://www.ncbi.nlm.nih.gov/pubmed/33228247
http://dx.doi.org/10.3390/ma13225240

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