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Contactless Measurement of Sheet Resistance of Nanomaterial Using Waveguide Reflection Method
Conductive nanomaterials are widely studied and used. The four-point probe method has been widely used to measure nanomaterials’ sheet resistance, denoted as [Formula: see text]. However, for materials sensitive to contamination or physical damage, contactless measurement is highly recommended if no...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7699489/ https://www.ncbi.nlm.nih.gov/pubmed/33228247 http://dx.doi.org/10.3390/ma13225240 |