Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

A speckle-based method for the X-ray crystal diffraction wavefront measurement is implemented, and the slope errors of channel-cut crystals with different surface characteristics are measured. The method uses a speckle scanning technique generated by a scattering membrane translated using a piezo mo...

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Detalles Bibliográficos
Autores principales: Xue, Lian, Luo, Hongxin, Diao, Qianshun, Yang, Fugui, Wang, Jie, Li, Zhongliang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7699849/
https://www.ncbi.nlm.nih.gov/pubmed/33233739
http://dx.doi.org/10.3390/s20226660

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7699849/
https://www.ncbi.nlm.nih.gov/pubmed/33233739
http://dx.doi.org/10.3390/s20226660

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