Probing the Roughness of Porphyrin Thin Films with X‐ray Photoelectron Spectroscopy

Thin‐film growth of molecular systems is of interest for many applications, such as for instance organic electronics. In this study, we demonstrate how X‐ray photoelectron spectroscopy (XPS) can be used to study the growth behavior of such molecular systems. In XPS, coverages are often calculated as...

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Detalles Bibliográficos
Autores principales: Kataev, Elmar, Wechsler, Daniel, Williams, Federico J., Köbl, Julia, Tsud, Natalia, Franchi, Stefano, Steinrück, Hans‐Peter, Lytken, Ole
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2020
Materias:
Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7702074/
https://www.ncbi.nlm.nih.gov/pubmed/32820833
http://dx.doi.org/10.1002/cphc.202000568

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7702074/
https://www.ncbi.nlm.nih.gov/pubmed/32820833
http://dx.doi.org/10.1002/cphc.202000568

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