Genome-wide association studies in tropical maize germplasm reveal novel and known genomic regions for resistance to Northern corn leaf blight

Northern Corn Leaf Blight (NCLB) caused by Setosphaeria turcica, is one of the most important diseases of maize world-wide, and one of the major reasons behind yield losses in maize crop in Asia. In the present investigation, a high-resolution genome wide association study (GWAS) was conducted for N...

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Detalles Bibliográficos
Autores principales: Rashid, Zerka, Sofi, Mehrajuddin, Harlapur, Sharanappa I., Kachapur, Rajashekhar M., Dar, Zahoor Ahmed, Singh, Pradeep Kumar, Zaidi, Pervez Haider, Vivek, Bindiganavile Sampath, Nair, Sudha Krishnan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7738672/
https://www.ncbi.nlm.nih.gov/pubmed/33319847
http://dx.doi.org/10.1038/s41598-020-78928-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7738672/
https://www.ncbi.nlm.nih.gov/pubmed/33319847
http://dx.doi.org/10.1038/s41598-020-78928-5

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