Impact and Correction of Analytical Positioning on Accuracy of Zircon U-Pb Dating by SIMS

Secondary ion mass spectrometry (SIMS) is one of the most important analytical tools for geochronology, especially for zircon U-Pb dating. Due to its advantages in spatial resolution and analytical precision, SIMS is the preferred option for multi-spot analyses on single zircon grain with complex st...

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Detalles Bibliográficos
Autores principales: Liu, Yu, Li, Qiu-Li, Ling, Xiao-Xiao, Tang, Guo-Qiang, Li, Jiao, Li, Xian-Hua
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2020
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7744676/
https://www.ncbi.nlm.nih.gov/pubmed/33344421
http://dx.doi.org/10.3389/fchem.2020.605646

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7744676/
https://www.ncbi.nlm.nih.gov/pubmed/33344421
http://dx.doi.org/10.3389/fchem.2020.605646

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