Cargando…
Impact and Correction of Analytical Positioning on Accuracy of Zircon U-Pb Dating by SIMS
Secondary ion mass spectrometry (SIMS) is one of the most important analytical tools for geochronology, especially for zircon U-Pb dating. Due to its advantages in spatial resolution and analytical precision, SIMS is the preferred option for multi-spot analyses on single zircon grain with complex st...
Autores principales: | Liu, Yu, Li, Qiu-Li, Ling, Xiao-Xiao, Tang, Guo-Qiang, Li, Jiao, Li, Xian-Hua |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Frontiers Media S.A.
2020
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7744676/ https://www.ncbi.nlm.nih.gov/pubmed/33344421 http://dx.doi.org/10.3389/fchem.2020.605646 |
Ejemplares similares
-
The appearance and duration of the Jehol Biota: Constraint from SIMS U-Pb zircon dating for the Huajiying Formation in northern China
por: Yang, Saihong, et al.
Publicado: (2020) -
U–Pb dating for zircons from granitic rocks in southwestern Cambodia
por: Uchida, Etsuo, et al.
Publicado: (2023) -
GZ7 and GZ8 – Two Zircon Reference Materials for SIMS U‐Pb Geochronology
por: Nasdala, Lutz, et al.
Publicado: (2018) -
Dating the megalithic culture of laos: Radiocarbon, optically stimulated luminescence and U/Pb zircon results
por: Shewan, Louise, et al.
Publicado: (2021) -
Improvement in the Analytical Capabilities of LA-ICP-MS for High Spatial Resolution U-Pb Dating of Zircon Using Mixed-Gas Plasma
por: Shenghua, Liu, et al.
Publicado: (2020)