Quantitative material analysis using secondary electron energy spectromicroscopy

This paper demonstrates how secondary electron energy spectroscopy (SEES) performed inside a scanning electron microscope (SEM) can be used to map sample atomic number and acquire bulk valence band density of states (DOS) information at low primary beam voltages. The technique uses an electron energ...

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Detalles Bibliográficos
Autores principales: Han, W., Zheng, M., Banerjee, A., Luo, Y. Z., Shen, L., Khursheed, A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7746715/
https://www.ncbi.nlm.nih.gov/pubmed/33335154
http://dx.doi.org/10.1038/s41598-020-78973-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7746715/
https://www.ncbi.nlm.nih.gov/pubmed/33335154
http://dx.doi.org/10.1038/s41598-020-78973-0

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