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In-situ monitoring for liquid metal jetting using a millimeter-wave impedance diagnostic
This article presents a millimeter-wave diagnostic for the in-situ monitoring of liquid metal jetting additive manufacturing systems. The diagnostic leverages a T-junction waveguide device to monitor impedance changes due to jetted metal droplets in real time. An analytical formulation for the time-...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7749153/ https://www.ncbi.nlm.nih.gov/pubmed/33339896 http://dx.doi.org/10.1038/s41598-020-79266-2 |