Three‐dimensional reconstruction of porous polymer films from FIB‐SEM nanotomography data using random forests

Combined focused ion beam and scanning electron microscope (FIB‐SEM) tomography is a well‐established technique for high resolution imaging and reconstruction of the microstructure of a wide range of materials. Segmentation of FIB‐SEM data is complicated due to a number of factors; the most prominen...

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Detalles Bibliográficos
Autores principales: RÖDING, M., FAGER, C., OLSSON, A., VON CORSWANT, C., OLSSON, E., LORÉN, N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2020
Materias:
Original Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7754501/
https://www.ncbi.nlm.nih.gov/pubmed/33439497
http://dx.doi.org/10.1111/jmi.12950

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7754501/
https://www.ncbi.nlm.nih.gov/pubmed/33439497
http://dx.doi.org/10.1111/jmi.12950

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