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Three‐dimensional reconstruction of porous polymer films from FIB‐SEM nanotomography data using random forests
Combined focused ion beam and scanning electron microscope (FIB‐SEM) tomography is a well‐established technique for high resolution imaging and reconstruction of the microstructure of a wide range of materials. Segmentation of FIB‐SEM data is complicated due to a number of factors; the most prominen...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
John Wiley and Sons Inc.
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7754501/ https://www.ncbi.nlm.nih.gov/pubmed/33439497 http://dx.doi.org/10.1111/jmi.12950 |