Swept-Source-Based Chromatic Confocal Microscopy

Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed t...

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Detalles Bibliográficos
Autores principales: Jeong, Dawoon, Park, Se Jin, Jang, Hansol, Kim, Hyunjoo, Kim, Jaesun, Kim, Chang-Seok
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Letter
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7767395/
https://www.ncbi.nlm.nih.gov/pubmed/33371378
http://dx.doi.org/10.3390/s20247347

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7767395/
https://www.ncbi.nlm.nih.gov/pubmed/33371378
http://dx.doi.org/10.3390/s20247347

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