X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors

X-ray single-grating interferometry was applied to conduct accurate wavefront corrections for hard X-ray nanofocusing mirrors. Systematic errors in the interferometer, originating from a grating, a detector, and alignment errors of the components, were carefully examined. Based on the measured wavef...

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Detalles Bibliográficos
Autores principales: Yamada, Jumpei, Inoue, Takato, Nakamura, Nami, Kameshima, Takashi, Yamauchi, Kazuto, Matsuyama, Satoshi, Yabashi, Makina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Letter
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7767480/
https://www.ncbi.nlm.nih.gov/pubmed/33371522
http://dx.doi.org/10.3390/s20247356

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7767480/
https://www.ncbi.nlm.nih.gov/pubmed/33371522
http://dx.doi.org/10.3390/s20247356

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