Structure-dependent amplification for denoising and background correction in Fourier ptychographic microscopy

Fourier Ptychographic Microscopy (FPM) allows high resolution imaging using iterative phase retrieval to recover an estimate of the complex object from a series of images captured under oblique illumination. FPM is particularly sensitive to noise and uncorrected background signals as it relies on co...

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Detalles Bibliográficos
Autores principales: Claveau, Rémy, Manescu, Petru, Fernandez-Reyes, Delmiro, Shaw, Michael
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Optical Society of America 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7771892/
https://www.ncbi.nlm.nih.gov/pubmed/33379658
http://dx.doi.org/10.1364/OE.403780

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7771892/
https://www.ncbi.nlm.nih.gov/pubmed/33379658
http://dx.doi.org/10.1364/OE.403780

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