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Structure-dependent amplification for denoising and background correction in Fourier ptychographic microscopy
Fourier Ptychographic Microscopy (FPM) allows high resolution imaging using iterative phase retrieval to recover an estimate of the complex object from a series of images captured under oblique illumination. FPM is particularly sensitive to noise and uncorrected background signals as it relies on co...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Optical Society of America
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7771892/ https://www.ncbi.nlm.nih.gov/pubmed/33379658 http://dx.doi.org/10.1364/OE.403780 |