Microstructural Origin of the Double Yield Points of the Metallocene Linear Low-Density Polyethylene (mLLDPE) Precursor Film under Uniaxial Tensile Deformation

The microstructural origin of the double yield points of metallocene linear low-density polyethylene (mLLDPE) precursor films has been studied with the assistance of the synchrotron radiation small- and wide-angle X-ray scattering (SAXS/WAXS). It has been shown that the microstructural origin of the...

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Detalles Bibliográficos
Autores principales: Iqbal, Obaid, Habumugisha, Jean Claude, Feng, Shengyao, Lin, Yuanfei, Chen, Wei, Yu, Wancheng, Li, Liangbin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7794766/
https://www.ncbi.nlm.nih.gov/pubmed/33396888
http://dx.doi.org/10.3390/polym13010126

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7794766/
https://www.ncbi.nlm.nih.gov/pubmed/33396888
http://dx.doi.org/10.3390/polym13010126

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