Analysis of Sn-Bi Solders: X-ray Micro Computed Tomography Imaging and Microstructure Characterization in Relation to Properties and Liquid Phase Healing Potential

This work provides an analysis of X-ray micro computed tomography data of Sn-xBi solders with x = 20, 30, 35, 47, 58 wt.% Bi. The eutectic thickness, fraction of eutectic and primary phase are analyzed. Furthermore, the 3D data is evaluated by means of morphology parameters, such as, shape complexit...

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Detalles Bibliográficos
Autores principales: Siroky, Georg, Kraker, Elke, Rosc, Jördis, Kieslinger, Dietmar, Brunner, Roland, van der Zwaag, Sybrand, Kozeschnik, Ernst, Ecker, Werner
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7794811/
https://www.ncbi.nlm.nih.gov/pubmed/33396361
http://dx.doi.org/10.3390/ma14010153

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7794811/
https://www.ncbi.nlm.nih.gov/pubmed/33396361
http://dx.doi.org/10.3390/ma14010153

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