Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In,Ga)Se(2) Solar Cell

Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, the simultaneous assessment of composition, structur...

Descripción completa

Detalles Bibliográficos
Autores principales: Ossig, Christina, Strelow, Christian, Flügge, Jan, Kolditz, Andreas, Siebels, Jan, Garrevoet, Jan, Spiers, Kathryn, Seyrich, Martin, Brückner, Dennis, Pyrlik, Niklas, Hagemann, Johannes, Schropp, Andreas, Carron, Romain, Falkenberg, Gerald, Mews, Alf, Schroer, Christian G., Kipp, Tobias, Stuckelberger, Michael E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7796438/
https://www.ncbi.nlm.nih.gov/pubmed/33466442
http://dx.doi.org/10.3390/ma14010228

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7796438/
https://www.ncbi.nlm.nih.gov/pubmed/33466442
http://dx.doi.org/10.3390/ma14010228

Ejemplares similares