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Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In,Ga)Se(2) Solar Cell
Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, the simultaneous assessment of composition, structur...
Autores principales: | Ossig, Christina, Strelow, Christian, Flügge, Jan, Kolditz, Andreas, Siebels, Jan, Garrevoet, Jan, Spiers, Kathryn, Seyrich, Martin, Brückner, Dennis, Pyrlik, Niklas, Hagemann, Johannes, Schropp, Andreas, Carron, Romain, Falkenberg, Gerald, Mews, Alf, Schroer, Christian G., Kipp, Tobias, Stuckelberger, Michael E. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7796438/ https://www.ncbi.nlm.nih.gov/pubmed/33466442 http://dx.doi.org/10.3390/ma14010228 |
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