Scalable long read self-correction and assembly polishing with multiple sequence alignment

Third-generation sequencing technologies allow to sequence long reads of tens of kbp, that are expected to solve various problems. However, they display high error rates, currently capped around 10%. Self-correction is thus regularly used in long reads analysis projects. We introduce CONSENT, a new...

Descripción completa

Detalles Bibliográficos
Autores principales: Morisse, Pierre, Marchet, Camille, Limasset, Antoine, Lecroq, Thierry, Lefebvre, Arnaud
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7804095/
https://www.ncbi.nlm.nih.gov/pubmed/33436980
http://dx.doi.org/10.1038/s41598-020-80757-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7804095/
https://www.ncbi.nlm.nih.gov/pubmed/33436980
http://dx.doi.org/10.1038/s41598-020-80757-5

Ejemplares similares