Multi-slice ptychography enables high-resolution measurements in extended chemical reactors

Ptychographic X-ray microscopy is an ideal tool to observe chemical processes under in situ conditions. Chemical reactors, however, are often thicker than the depth of field, limiting the lateral spatial resolution in projection images. To overcome this limit and reach higher lateral spatial resolut...

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Detalles Bibliográficos
Autores principales: Kahnt, Maik, Grote, Lukas, Brückner, Dennis, Seyrich, Martin, Wittwer, Felix, Koziej, Dorota, Schroer, Christian G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7810740/
https://www.ncbi.nlm.nih.gov/pubmed/33452343
http://dx.doi.org/10.1038/s41598-020-80926-6

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7810740/
https://www.ncbi.nlm.nih.gov/pubmed/33452343
http://dx.doi.org/10.1038/s41598-020-80926-6

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