Massively parallel cantilever-free atomic force microscopy

Resolution and field-of-view often represent a fundamental tradeoff in microscopy. Atomic force microscopy (AFM), in which a cantilevered probe deflects under the influence of local forces as it scans across a substrate, is a key example of this tradeoff with high resolution imaging being largely li...

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Detalles Bibliográficos
Autores principales: Cao, Wenhan, Alsharif, Nourin, Huang, Zhongjie, White, Alice E., Wang, YuHuang, Brown, Keith A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7810748/
https://www.ncbi.nlm.nih.gov/pubmed/33452253
http://dx.doi.org/10.1038/s41467-020-20612-3

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7810748/
https://www.ncbi.nlm.nih.gov/pubmed/33452253
http://dx.doi.org/10.1038/s41467-020-20612-3

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