Large field-of-view nanometer-sectioning microscopy by using metal-induced energy transfer and biexponential lifetime analysis

Total internal reflection fluorescence (TIRF) microscopy, which has about 100-nm axial excitation depth, is the method of choice for nanometer-sectioning imaging for decades. Lately, several new imaging techniques, such as variable angle TIRF microscopy, supercritical-angle fluorescence microscopy,...

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Detalles Bibliográficos
Autores principales: Hwang, Wonsang, Seo, Jinwon, Kim, DongEun, Lee, Chang Jun, Choi, In-Hong, Yoo, Kyung-Hwa, Kim, Dug Young
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7815909/
https://www.ncbi.nlm.nih.gov/pubmed/33469155
http://dx.doi.org/10.1038/s42003-020-01628-3

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7815909/
https://www.ncbi.nlm.nih.gov/pubmed/33469155
http://dx.doi.org/10.1038/s42003-020-01628-3

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