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Depth-dependent EBIC microscopy of radial-junction Si micropillar arrays
Recent advances in fabrication have enabled radial-junction architectures for cost-effective and high-performance optoelectronic devices. Unlike a planar PN junction, a radial-junction geometry maximizes the optical interaction in the three-dimensional (3D) structures, while effectively extracting t...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer Singapore
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7818315/ https://www.ncbi.nlm.nih.gov/pubmed/33580446 http://dx.doi.org/10.1186/s42649-020-00037-4 |