Reciprocal space slicing: A time-efficient approach to femtosecond x-ray diffraction

An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measu...

Descripción completa

Detalles Bibliográficos
Autores principales: Zeuschner, S. P., Mattern, M., Pudell, J.-E., von Reppert, A., Rössle, M., Leitenberger, W., Schwarzkopf, J., Boschker, J. E., Herzog, M., Bargheer, M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Crystallographic Association 2021
Materias:
ARTICLES
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7822632/
https://www.ncbi.nlm.nih.gov/pubmed/33532514
http://dx.doi.org/10.1063/4.0000040

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7822632/
https://www.ncbi.nlm.nih.gov/pubmed/33532514
http://dx.doi.org/10.1063/4.0000040

Ejemplares similares