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Reciprocal space slicing: A time-efficient approach to femtosecond x-ray diffraction

An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measu...

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Detalles Bibliográficos
Autores principales:	Zeuschner, S. P., Mattern, M., Pudell, J.-E., von Reppert, A., Rössle, M., Leitenberger, W., Schwarzkopf, J., Boschker, J. E., Herzog, M., Bargheer, M.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Crystallographic Association 2021
Materias:	ARTICLES
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7822632/ https://www.ncbi.nlm.nih.gov/pubmed/33532514 http://dx.doi.org/10.1063/4.0000040

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