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Heptagons in the Basal Plane of Graphene Nanoflakes Analyzed by Simulated X-ray Photoelectron Spectroscopy
[Image: see text] The performance of graphene-based electronic devices depends critically on the existence of topological defects such as heptagons. Identifying heptagons at the atomic scale is important to completely understand the electronic properties of these materials. In this study, we report...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7841947/ https://www.ncbi.nlm.nih.gov/pubmed/33521477 http://dx.doi.org/10.1021/acsomega.0c05717 |