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Simultaneous acquisition of current and lateral force signals during AFM for characterising the piezoelectric and triboelectric effects of ZnO nanorods
Atomic force microscopy (AFM) is central to investigating the piezoelectric potentials of one-dimensional nanomaterials. The AFM probe is used to deflect individual piezoelectric nanorods and to measure the resultant current. However, the torsion data of AFM probes have not been exploited to elucida...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7859228/ https://www.ncbi.nlm.nih.gov/pubmed/33536507 http://dx.doi.org/10.1038/s41598-021-82506-8 |