A Novel Method to Maintain the Sample Position and Pressure in Differentially Pumped Systems Below the Resolution Limit of Optical Microscopy Techniques

We present a new method to maintain constant gas pressure over a sample during in situ measurements. The example shown here is a differentially pumped high-pressure X-ray photoelectron spectroscopy system, but this technique could be applied to many in situ instruments. By using the pressure of the...

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Detalles Bibliográficos
Autores principales: Goodwin, Christopher M., Alexander, John D., Weston, Matthew, Degerman, David, Shipilin, Mikhail, Loemker, Patrick, Amann, Peter
Formato: Online Artículo Texto
Lenguaje:English
Publicado: SAGE Publications 2020
Materias:
Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7859668/
https://www.ncbi.nlm.nih.gov/pubmed/32597682
http://dx.doi.org/10.1177/0003702820942798

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7859668/
https://www.ncbi.nlm.nih.gov/pubmed/32597682
http://dx.doi.org/10.1177/0003702820942798

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