BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits

A new sensor topology meant to extract figures of merit of radio-frequency analog integrated circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 μm complementary metal-oxide-semiconductor (CMOS) technology, it comprised two blocks: a single metal-oxide-semiconductor (MOS)...

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Detalles Bibliográficos
Autores principales: Altet, Josep, Barajas, Enrique, Mateo, Diego, Billong, Alexandre, Aragones, Xavier, Perpiñà, Xavier, Reverter, Ferran
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7865451/
https://www.ncbi.nlm.nih.gov/pubmed/33530334
http://dx.doi.org/10.3390/s21030805

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7865451/
https://www.ncbi.nlm.nih.gov/pubmed/33530334
http://dx.doi.org/10.3390/s21030805

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