EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging

For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Electron Lasers, laser-driven betatron and plasma-base...

Descripción completa

Detalles Bibliográficos
Autores principales: de La Rochefoucauld, Ombeline, Dovillaire, Guillaume, Harms, Fabrice, Idir, Mourad, Huang, Lei, Levecq, Xavier, Piponnier, Martin, Zeitoun, Philippe
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7865934/
https://www.ncbi.nlm.nih.gov/pubmed/33525501
http://dx.doi.org/10.3390/s21030874

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7865934/
https://www.ncbi.nlm.nih.gov/pubmed/33525501
http://dx.doi.org/10.3390/s21030874

Ejemplares similares