NIR self-powered photodetection and gate tunable rectification behavior in 2D GeSe/MoSe(2) heterojunction diode

Two-dimensional (2D) heterostructure with atomically sharp interface holds promise for future electronics and optoelectronics because of their multi-functionalities. Here we demonstrate gate-tunable rectifying behavior and self-powered photovoltaic characteristics of novel p-GeSe/n-MoSe(2) van der waal heterojunction (vdW HJ). A substantial increase in rectification behavior was observed when the devices were subjected to gate bias. The highest rectification of ~ 1 × 10(4) was obtained at V(g) = − 40 V. Remarkable rectification behavior of the p-n diode is solely attributed to the sharp interface between metal and GeSe/MoSe(2). The device exhibits a high photoresponse towards NIR (850 nm). A high photoresponsivity of 465 mAW(−1), an excellent EQE of 670%, a fast rise time of 180 ms, and a decay time of 360 ms were obtained. Furthermore, the diode exhibits detectivity (D) of 7.3 × 10(9) Jones, the normalized photocurrent to the dark current ratio (NPDR) of 1.9 × 10(10) W(−1), and the noise equivalent power (NEP) of 1.22 × 10(–13) WHz(−1/2). The strong light-matter interaction stipulates that the GeSe/MoSe(2) diode may open new realms in multi-functional electronics and optoelectronics applications.