Light Emission in Metal–Semiconductor Tunnel Junctions: Direct Evidence for Electron Heating by Plasmon Decay

[Image: see text] We study metal–insulator–semiconductor tunnel junctions where the metal electrode is a patterned gold layer, the insulator is a thin layer of Al(2)O(3), and the semiconductor is p-type silicon. We observe light emission due to plasmon-assisted inelastic tunneling from the metal to...

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Detalles Bibliográficos
Autores principales: Shalem, Guy, Erez-Cohen, Omer, Mahalu, Diana, Bar-Joseph, Israel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2021
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7883388/
https://www.ncbi.nlm.nih.gov/pubmed/33497237
http://dx.doi.org/10.1021/acs.nanolett.0c03945

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7883388/
https://www.ncbi.nlm.nih.gov/pubmed/33497237
http://dx.doi.org/10.1021/acs.nanolett.0c03945

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