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Light Emission in Metal–Semiconductor Tunnel Junctions: Direct Evidence for Electron Heating by Plasmon Decay
[Image: see text] We study metal–insulator–semiconductor tunnel junctions where the metal electrode is a patterned gold layer, the insulator is a thin layer of Al(2)O(3), and the semiconductor is p-type silicon. We observe light emission due to plasmon-assisted inelastic tunneling from the metal to...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7883388/ https://www.ncbi.nlm.nih.gov/pubmed/33497237 http://dx.doi.org/10.1021/acs.nanolett.0c03945 |