Growth and Atomic‐Scale Characterization of Ultrathin Silica and Germania Films: The Crucial Role of the Metal Support

The present review reports on the preparation and atomic‐scale characterization of the thinnest possible films of the glass‐forming materials silica and germania. To this end state‐of‐the‐art surface science techniques, in particular scanning probe microscopy, and density functional theory calculati...

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Detalles Bibliográficos
Autores principales: Lewandowski, Adrián Leandro, Tosoni, Sergio, Gura, Leonard, Yang, Zechao, Fuhrich, Alexander, Prieto, Mauricio J., Schmidt, Thomas, Usvyat, Denis, Schneider, Wolf‐Dieter, Heyde, Markus, Pacchioni, Gianfranco, Freund, Hans‐Joachim
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2020
Materias:
Reviews
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7898484/
https://www.ncbi.nlm.nih.gov/pubmed/33118653
http://dx.doi.org/10.1002/chem.202001806

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7898484/
https://www.ncbi.nlm.nih.gov/pubmed/33118653
http://dx.doi.org/10.1002/chem.202001806

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