Wavelet-based background and noise subtraction for fluorescence microscopy images

Fluorescence microscopy images are inevitably contaminated by background intensity contributions. Fluorescence from out-of-focus planes and scattered light are important sources of slowly varying, low spatial frequency background, whereas background varying from pixel to pixel (high frequency noise)...

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Detalles Bibliográficos
Autores principales: Hüpfel, Manuel, Yu. Kobitski, Andrei, Zhang, Weichun, Nienhaus, G. Ulrich
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Optical Society of America 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7901331/
https://www.ncbi.nlm.nih.gov/pubmed/33680553
http://dx.doi.org/10.1364/BOE.413181

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7901331/
https://www.ncbi.nlm.nih.gov/pubmed/33680553
http://dx.doi.org/10.1364/BOE.413181

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