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Wavelet-based background and noise subtraction for fluorescence microscopy images
Fluorescence microscopy images are inevitably contaminated by background intensity contributions. Fluorescence from out-of-focus planes and scattered light are important sources of slowly varying, low spatial frequency background, whereas background varying from pixel to pixel (high frequency noise)...
Autores principales: | Hüpfel, Manuel, Yu. Kobitski, Andrei, Zhang, Weichun, Nienhaus, G. Ulrich |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Optical Society of America
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7901331/ https://www.ncbi.nlm.nih.gov/pubmed/33680553 http://dx.doi.org/10.1364/BOE.413181 |
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