Effectiveness of Electrical and Optical Detection at Pixel Circuit on Thin-Film Transistors

The paper presents a typology of electrical open and short defects on thin-film transistors (TFT) using an electrical tester and automatic optical inspection (AOI). The experiment takes the glass 8.5th generation to detect the electrical characteristics engaged with time delay and integration (TDI)...

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Detalles Bibliográficos
Autor principal: Tzu, Fu-Ming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7910850/
https://www.ncbi.nlm.nih.gov/pubmed/33513890
http://dx.doi.org/10.3390/mi12020135

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7910850/
https://www.ncbi.nlm.nih.gov/pubmed/33513890
http://dx.doi.org/10.3390/mi12020135

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