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Effectiveness of Electrical and Optical Detection at Pixel Circuit on Thin-Film Transistors
The paper presents a typology of electrical open and short defects on thin-film transistors (TFT) using an electrical tester and automatic optical inspection (AOI). The experiment takes the glass 8.5th generation to detect the electrical characteristics engaged with time delay and integration (TDI)...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2021
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7910850/ https://www.ncbi.nlm.nih.gov/pubmed/33513890 http://dx.doi.org/10.3390/mi12020135 |