Cargando…
Cryogenic Transport Characteristics of P-Type Gate-All-Around Silicon Nanowire MOSFETs
A 16-nm-L(g) p-type Gate-all-around (GAA) silicon nanowire (Si NW) metal oxide semiconductor field effect transistor (MOSFET) was fabricated based on the mainstream bulk fin field-effect transistor (FinFET) technology. The temperature dependence of electrical characteristics for normal MOSFET as wel...
Autores principales: | Gu, Jie, Zhang, Qingzhu, Wu, Zhenhua, Yao, Jiaxin, Zhang, Zhaohao, Zhu, Xiaohui, Wang, Guilei, Li, Junjie, Zhang, Yongkui, Cai, Yuwei, Xu, Renren, Xu, Gaobo, Xu, Qiuxia, Yin, Huaxiang, Luo, Jun, Wang, Wenwu, Ye, Tianchun |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7911106/ https://www.ncbi.nlm.nih.gov/pubmed/33530292 http://dx.doi.org/10.3390/nano11020309 |
Ejemplares similares
-
Optimization of Structure and Electrical Characteristics for Four-Layer Vertically-Stacked Horizontal Gate-All-Around Si Nanosheets Devices
por: Zhang, Qingzhu, et al.
Publicado: (2021) -
Improved Subthreshold Characteristics by Back-Gate Coupling on Ferroelectric ETSOI FETs
por: Zhang, Zhaohao, et al.
Publicado: (2022) -
4-Levels Vertically Stacked SiGe Channel Nanowires Gate-All-Around Transistor with Novel Channel Releasing and Source and Drain Silicide Process
por: Cheng, Xiaohong, et al.
Publicado: (2022) -
pMOSFETs Featuring ALD W Filling Metal Using SiH(4) and B(2)H(6) Precursors in 22 nm Node CMOS Technology
por: Wang, Guilei, et al.
Publicado: (2017) -
Study of Silicon Nitride Inner Spacer Formation in Process of Gate-all-around Nano-Transistors
por: Li, Junjie, et al.
Publicado: (2020)