Candidate Genes and Quantitative Trait Loci for Grain Yield and Seed Size in Durum Wheat

Grain yield (YLD) is affected by thousand kernel weight (TKW) which reflects the combination of grain length (GL), grain width (GW) and grain area (AREA). Grain weight is also influenced by heading time (HT) and plant height (PH). To detect candidate genes and quantitative trait loci (QTL) of yield...

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Detalles Bibliográficos
Autores principales: Mangini, Giacomo, Blanco, Antonio, Nigro, Domenica, Signorile, Massimo Antonio, Simeone, Rosanna
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7916090/
https://www.ncbi.nlm.nih.gov/pubmed/33562879
http://dx.doi.org/10.3390/plants10020312

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7916090/
https://www.ncbi.nlm.nih.gov/pubmed/33562879
http://dx.doi.org/10.3390/plants10020312

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