Raman Spectroscopy-Based Quality Control of “Silicon-On-Insulator” Nanowire Chips for the Detection of Brain Cancer-Associated MicroRNA in Plasma

Application of micro-Raman spectroscopy for the monitoring of quality of nanowire sensor chips fabrication has been demonstrated. Nanowire chips have been fabricated on the basis of «silicon-on-insulator» (SOI) structures (SOI-NW chips). The fabrication of SOI-NW chips was performed by optical litog...

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Detalles Bibliográficos
Autores principales: Malsagova, Kristina A., Popov, Vladimir P., Kupriyanov, Igor N., Pleshakova, Tatyana O., Galiullin, Rafael A., Kozlov, Andrey F., Shumov, Ivan D., Larionov, Dmitry I., Tikhonenko, Fedor V., Kapustina, Svetlana I., Ziborov, Vadim S., Petrov, Oleg F., Gadzhieva, Olga A., Bashiryan, Boris A., Shimansky, Vadim N., Archakov, Alexander I., Ivanov, Yuri D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7918486/
https://www.ncbi.nlm.nih.gov/pubmed/33668578
http://dx.doi.org/10.3390/s21041333

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7918486/
https://www.ncbi.nlm.nih.gov/pubmed/33668578
http://dx.doi.org/10.3390/s21041333

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