Scanning Thermal Microscopy of Ultrathin Films: Numerical Studies Regarding Cantilever Displacement, Thermal Contact Areas, Heat Fluxes, and Heat Distribution

New micro- and nanoscale devices require electrically isolating materials with specific thermal properties. One option to characterize these thermal properties is the atomic force microscopy (AFM)-based scanning thermal microscopy (SThM) technique. It enables qualitative mapping of local thermal con...

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Detalles Bibliográficos
Autores principales: Metzke, Christoph, Kühnel, Fabian, Weber, Jonas, Benstetter, Günther
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7919810/
https://www.ncbi.nlm.nih.gov/pubmed/33669205
http://dx.doi.org/10.3390/nano11020491

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7919810/
https://www.ncbi.nlm.nih.gov/pubmed/33669205
http://dx.doi.org/10.3390/nano11020491

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