Variation of Signal Reflection on Electrodes of Silicon Mach-Zehnder Modulators: Influence of Nanoscale Variation and Mitigation Strategies

Driving signal reflection on traveling wave electrodes (TWEs) is a critical issue in Mach–Zehnder modulators. Fabrication variation often causes a random variation in the electrode impedance and the signal reflection, which induces modulation characteristics variation. The variation of reflection co...

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Detalles Bibliográficos
Autores principales: Zeng, Zhaobang, Ding, Ding, Gao, Qianyi, Yang, Nan, Zhao, Peiyan, Jiang, Wei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7920439/
https://www.ncbi.nlm.nih.gov/pubmed/33669399
http://dx.doi.org/10.3390/nano11020499

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7920439/
https://www.ncbi.nlm.nih.gov/pubmed/33669399
http://dx.doi.org/10.3390/nano11020499

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