Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk

BACKGROUND: Test resources are usually limited and therefore it is often not possible to completely test an application before a release. To cope with the problem of scarce resources, development teams can apply defect prediction to identify fault-prone code regions. However, defect prediction tends...

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Detalles Bibliográficos
Autores principales: Niedermayr, Rainer, Röhm, Tobias, Wagner, Stefan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: PeerJ Inc. 2019
Materias:
Data Mining and Machine Learning
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7924551/
https://www.ncbi.nlm.nih.gov/pubmed/33816840
http://dx.doi.org/10.7717/peerj-cs.187

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7924551/
https://www.ncbi.nlm.nih.gov/pubmed/33816840
http://dx.doi.org/10.7717/peerj-cs.187

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