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Paralleling insulated-gate bipolar transistors in the H-bridge structure to reduce current stress
In this study we present the new power electronic circuit implementation to create the arbitrary near-rectangular electromagnetic pulse. To this end, we develop a parallel- Insulated-gate bipolar transistors (IGBT)-based magnetic pulse generator utilizing the H-bridge architecture. This approach eff...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer International Publishing
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7925468/ https://www.ncbi.nlm.nih.gov/pubmed/33748674 http://dx.doi.org/10.1007/s42452-021-04420-y |
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author | Memarian Sorkhabi, Majid Wendt, Karen Rogers, Daniel Denison, Timothy |
author_facet | Memarian Sorkhabi, Majid Wendt, Karen Rogers, Daniel Denison, Timothy |
author_sort | Memarian Sorkhabi, Majid |
collection | PubMed |
description | In this study we present the new power electronic circuit implementation to create the arbitrary near-rectangular electromagnetic pulse. To this end, we develop a parallel- Insulated-gate bipolar transistors (IGBT)-based magnetic pulse generator utilizing the H-bridge architecture. This approach effectively reduces the current stress on the power switches while maintaining a simple structure using a single DC source and energy storage capacitor. Experimental results from the circuit characterization show that the proposed circuit is capable of repeatedly generating near-rectangular magnetic pulses and enables the generation of configurable and stable magnetic pulses without causing excessive device stresses. The introduced device enables the production of near-rectangular pulse trains for modulated magnetic stimuli. The maximum positive pulse width in the proposed neurostimulator is up to 600 µs, which is adjustable by the operator at the step resolution of 10 µs. The maximum transferred energy to the treatment coil was measured to be 100.4 J. The proposed transcranial magnetic stimulator (TMS) device enables more flexible magnetic stimulus shaping by H-bridge architecture and parallel IGBTs, which can effectively mitigate the current stress on power switches for repetitive treatment protocols. SUPPLEMENTARY INFORMATION: The online version contains supplementary material available at 10.1007/s42452-021-04420-y. |
format | Online Article Text |
id | pubmed-7925468 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | Springer International Publishing |
record_format | MEDLINE/PubMed |
spelling | pubmed-79254682021-03-19 Paralleling insulated-gate bipolar transistors in the H-bridge structure to reduce current stress Memarian Sorkhabi, Majid Wendt, Karen Rogers, Daniel Denison, Timothy SN Appl Sci Research Article In this study we present the new power electronic circuit implementation to create the arbitrary near-rectangular electromagnetic pulse. To this end, we develop a parallel- Insulated-gate bipolar transistors (IGBT)-based magnetic pulse generator utilizing the H-bridge architecture. This approach effectively reduces the current stress on the power switches while maintaining a simple structure using a single DC source and energy storage capacitor. Experimental results from the circuit characterization show that the proposed circuit is capable of repeatedly generating near-rectangular magnetic pulses and enables the generation of configurable and stable magnetic pulses without causing excessive device stresses. The introduced device enables the production of near-rectangular pulse trains for modulated magnetic stimuli. The maximum positive pulse width in the proposed neurostimulator is up to 600 µs, which is adjustable by the operator at the step resolution of 10 µs. The maximum transferred energy to the treatment coil was measured to be 100.4 J. The proposed transcranial magnetic stimulator (TMS) device enables more flexible magnetic stimulus shaping by H-bridge architecture and parallel IGBTs, which can effectively mitigate the current stress on power switches for repetitive treatment protocols. SUPPLEMENTARY INFORMATION: The online version contains supplementary material available at 10.1007/s42452-021-04420-y. Springer International Publishing 2021-03-02 2021 /pmc/articles/PMC7925468/ /pubmed/33748674 http://dx.doi.org/10.1007/s42452-021-04420-y Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
spellingShingle | Research Article Memarian Sorkhabi, Majid Wendt, Karen Rogers, Daniel Denison, Timothy Paralleling insulated-gate bipolar transistors in the H-bridge structure to reduce current stress |
title | Paralleling insulated-gate bipolar transistors in the H-bridge structure to reduce current stress |
title_full | Paralleling insulated-gate bipolar transistors in the H-bridge structure to reduce current stress |
title_fullStr | Paralleling insulated-gate bipolar transistors in the H-bridge structure to reduce current stress |
title_full_unstemmed | Paralleling insulated-gate bipolar transistors in the H-bridge structure to reduce current stress |
title_short | Paralleling insulated-gate bipolar transistors in the H-bridge structure to reduce current stress |
title_sort | paralleling insulated-gate bipolar transistors in the h-bridge structure to reduce current stress |
topic | Research Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7925468/ https://www.ncbi.nlm.nih.gov/pubmed/33748674 http://dx.doi.org/10.1007/s42452-021-04420-y |
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